Publications

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Filters: Author is Hwang, N.  [Clear All Filters]
2004
C. W. Chang, Gan, C. L., Thompson, C. V., Pey, K. L., Choi, W. K., and Hwang, N., Mortality dependence of Cu dual damascene interconnects on adjacent segment, in Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics-2004, vol. 812, R. J. Carter, HauRiege, C. S., Lu, T. M., and Schulz, S. E. 2004, pp. 339 - 344.