Publications
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Filters: Author is Veteran, J. L. [Clear All Filters]
“Experimental characterization of the reliability of 3-terminal dual-damascene copper interconnect trees”, in Silicon Materials-Processing, Characterization and Reliability, vol. 716, 2002, pp. 431 - 436.
, “Length effects on the reliability of dual-damascene Cu interconnects”, in Silicon Materials-Processing, Characterization and Reliability, vol. 716, 2002, pp. 645 - 650.
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