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J. J. Clement, Riege, S. P., Cvijetic, R., and Thompson, C. V., Methodology for electromigration critical threshold design rule evaluation, Ieee Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 18, no. 5, pp. 576 - 581, 1999.
S. P. Riege, Thompson, C. V., and Clement, J. J., A hierarchical reliability analysis for circuit design evaluation, Ieee Transactions on Electron Devices, vol. 45, no. 10, pp. 2254 - 2257, 1998.