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Filters: Author is Gilmer, G. H.  [Clear All Filters]
S. Zhao, Agarwal, A. M., Benton, J. L., Gilmer, G. H., and Kimerling, L. C., Interstitial defect reactions in silicon, in Defects in Electronic Materials Ii, vol. 442, J. Michel, Kennedy, T., Wada, K., and Thonke, K. 1997, pp. 231 - 236.