Publications

Found 91 results
Filters: Author is Michel, J.  [Clear All Filters]
2004
J. F. Liu, Michel, J., Giziewicz, W., Cannon, D. D., Jongthammanurak, S., Danielson, D. T., Pan, D., Yasaitis, J., Wada, K., and Kimerling, L. C., A 20GHz, tensile strained Ge photodetector on Si platform with broad detection spectrum for optical communications and on-chip applications, in 2004 Ieee Leos Annual Meeting Conference Proceedings, Vols 1 and 2, 2004, pp. 150 - 151.
S. Akiyama, Wada, K., Michel, J., Kimerling, L. C., Popovic, M. A., and Haus, H. A., Air trench waveguide bend for high density optical integration, in Integrated Optics: Devices, Materials, and Technologies Viii, vol. 5355, Y. Sidorin and Tervonen, A. 2004, pp. 14 - 21.
J. F. Liu, Cannon, D. D., Wada, K., Ishikawa, Y., Danielson, D. T., Jongthammanurak, S., Michel, J., and Kimerling, L. C., Deformation potential constants of biaxially tensile stressed Ge epitaxial films on Si(100), Physical Review B, vol. 70, no. 15, 2004.
S. Saini, Chen, K., Duan, X. M., Michel, J., Kimerling, L. C., and Lipson, M., Er2O3 for high-gain waveguide amplifiers, Journal of Electronic Materials, vol. 33, no. 7, pp. 809 - 814, 2004.
S. Saini, Sandland, J. G., Eshed, A., Sparacin, D. K., Dal Negro, L., Michel, J., and Kimerling, L. C., A high index contrast silicon oxynitride materials platform for Er-doped microphotonic amplifiers, in New Materials for Microphotonics, vol. 817, J. H. Shin, Brongersma, M., Buchal, C., and Priolo, F. 2004, pp. 27 - 33.
L. C. Kimerling, Dal Negro, L., Saini, S., Yi, Y., Ahn, D., Akiyama, S., Cannon, D., Liu, J., Sandland, J. G., Sparacin, D., Michel, J., Wada, K., and Watts, M. R., Monolithic Silicon Microphotonics, Silicon Photonics, vol. 94, pp. 89 - 119, 2004.
L. Dal Negro, Stolfi, M., Yi, Y., Michel, J., Duan, X., Kimerling, L. C., LeBlanc, J., and Haavisto, J., Omnidirectional reflectance and optical gap properties of Si/SiO2 Thue-Morse quasicrystals, in New Materials for Microphotonics, vol. 817, J. H. Shin, Brongersma, M., Buchal, C., and Priolo, F. 2004, pp. 75 - 81.
L. Dal Negro, Stolfi, M., Yi, Y., Michel, J., Duan, X., Kimerling, L. C., LeBlanc, J., and Haavisto, J., Photon band gap properties and omnidirectional reflectance in Si/SiO2 Thue-Morse quasicrystals, Applied Physics Letters, vol. 84, no. 25, pp. 5186 - 5188, 2004.
J. F. Liu, Cannon, D. D., Wada, K., Ishikawa, Y., Jongthammanurak, S., Danielson, D. T., Michel, J., and Kimerling, L. C., Silicidation-induced band gap shrinkage in Ge epitaxial films on Si, Applied Physics Letters, vol. 84, no. 5, pp. 660 - 662, 2004.
D. D. Cannon, Liu, J. F., Ishikawa, Y., Wada, K., Danielson, D. T., Jongthammanurak, S., Michel, J., and Kimerling, L. C., Tensile strained epitaxial Ge films on Si(100) substrates with potential application in L-band telecommunications, Applied Physics Letters, vol. 84, no. 6, pp. 906 - 908, 2004.

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