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J. Lappalainen, Tuller, H. L., and Lantto, V., Electronic conductivity and dielectric properties of nanocrystalline CeO2 films, Journal of Electroceramics, vol. 13, no. 1-3, pp. 129 - 133, 2004.
J. Lappalainen, Kek, D., and Tuller, H. L., High carrier density CeO2 dielectrics - implications for MOS devices, Journal of the European Ceramic Society, vol. 24, no. 6, pp. 1459 - 1462, 2004.
J. Lappalainen, Kek, D., and Tuller, H. L., Investigation of Pt/Si/CeO2/Pt MOS device structure by impedance spectroscopy, in Electrically Based Microstructural Characterization Iii, vol. 699, R. A. Gerhardt, Washabaugh, A. P., Alim, M. A., and Choi, G. M. 2002, pp. 173 - 183.