2018 Materials Day

Materials Day Symposium and Poster Session
October 10, 2018
Kresge Auditorium

This year’s annual MIT MRL Materials Day Symposium will be held on Wednesday, Oct. 10, 2018, in Kresge Auditorium from 8:30 a.m. to 3:30 p.m. The symposium will focus on imaging-enabled nanoscale research on the structure, properties and processing of materials. Immediately following will be the Poster Session in La Sala de Puerto Rico from 3:30 p.m. to 6 p.m. 

Confirmed speakers to date include MIT faculty members: 

* Frances Ross, Materials Science & Engineering, "Imaging and controlling nanoscale crystal growth using electron microscopy”
* James LeBeau, Materials Science & Engineering, “Accelerating the pace of materials characterization at the atomic scale: From machine learning to novel detectors”
* Sylvija Gradečak, Materials Science & Engineering, “An electron enters a bar: Electron microscopy beyond imaging”
* C. Cem Tasan, Materials Science & Engineering, “Nanoscale insights for macroscale solutions: Exploring novel damage-resistance mechanisms in metals"
* Karl Berggren, Electrical Engineering & Computer Science, “Using quantum mechanics to hack the electron microscope”
* David Moncton, MIT Nuclear Reactor Laboratory Director, TBA
Presentations will describe new tools and methods for atomic-scale structural and chemical characterization of materials, and application of these methods to optimization of processing and properties of materials for a wide range of applications.
Please save the date and keep checking our website for registration and further details.

Materials Day 2018

October 10, 2018
8:00am - 6:00pm
MIT Campus, Kresge Auditorium (Bldg. W16)

On Wednesday, October 10, 2018 the Materials Research Laboratory will host the Materials Day 2018 Symposium & Research Review Poster Session. The symposium will 
be held at MIT in the Kresge Auditorium (Bldg. W16). Registration check-in begins 
at 8:00am.

Abstract:
The theme of this year’s meeting will largely be focused on imaging-enabled nanoscale research on the structure, properties and processing of materials. Invited speakers will describe new tools and methods for atomic-scale structural and chemical characterization of materials, and application of these methods to optimization of processing and properties of materials for a wide range of applications. Results from imaging-based in situ studies of vapor- and liquid-phase processes for synthesis of nanostructured materials and in situ studies of nano- and micro-scale phenomena that can be used to engineer properties of bulk materials will be presented. Development of compact high-brilliance X-ray sources that can provide synchrotron-level materials analyses with laboratory-scale systems will also be discussed. Studies of nanoscale electronic, photonic, mechanical and catalytic properties of materials will be included and discussion of prospects for development of new state-of-the-art tools and methods for imaging-based and x–ray based materials research will be featured.

Invited Speakers
Keynote: Application of advanced microscopy to industrial problems: New tools give new insights
Matt Kulzick, Senior Research Scientist, BP

Imaging and controlling nanoscale crystal growth using electron
microscopy
Frances Ross, Department of Materials Science & Engineering, MIT

Compact synchrotron radiation sources enabling advanced x-ray imaging and diffraction methods in a laboratory setting
David Moncton, Director, NRL, MIT

Accelerating the pace of materials characterization at the atomic scale: from machine learning to novel detectors
James M. LeBeau, Department of Materials Science & Engineering, MIT

An electron walks into a bar... Electron microscopy beyond imaging
Sylvija Gradecak, Department of Materials Science & Engineering, MIT

Nanoscale insights for macroscale solutions: Exploring novel damage-resistance mechanisms in metals
Cem Tasan, Department of Materials Science & Engineering, MIT

Using quantum mechanics to hack the electron microscope
Karl Berggren, Electrical Engineering & Computer Science, MIT