Publications

Found 7 results
Filters: Author is Seel, S. C.  [Clear All Filters]
2005
T. Trimble, Tang, L., Vasiljevic, N., Dimitrov, N., van Schilfgaarde, M., Friesen, C., Thompson, C. V., Seel, S. C., Floro, J. A., and Sieradzki, K., “Anion adsorption induced reversal of coherency strain”, Physical Review Letters, vol. 95, no. 16, 2005.
S. C. Seel and Thompson, C. V., “Piezoresistive microcantilevers for in situ stress measurements during thin film deposition”, Review of Scientific Instruments, vol. 76, no. 7, 2005.
2004
C. Friesen, Seel, S. C., and Thompson, C. V., “Reversible stress changes at all stages of Volmer-Weber film growth”, Journal of Applied Physics, vol. 95, no. 3, pp. 1011 - 1020, 2004.
2003
S. C. Seel and Thompson, C. V., “Tensile stress generation during island coalescence for variable island-substrate contact angle”, Journal of Applied Physics, vol. 93, no. 11, pp. 9038 - 9042, 2003.
2001
J. A. Floro, Hearne, S. J., Hunter, J. A., Kotula, P., Chason, E., Seel, S. C., and Thompson, C. V., “The dynamic competition between stress generation and relaxation mechanisms during coalescence of Volmer-Weber thin films”, Journal of Applied Physics, vol. 89, no. 9, pp. 4886 - 4897, 2001.
2000
S. C. Seel, Thompson, C. V., Hearne, S. J., and Floro, J. A., “Tensile stress evolution during deposition of Volmer-Weber thin films”, Journal of Applied Physics, vol. 88, no. 12, pp. 7079 - 7088, 2000.
1996
S. C. Seel, CAREL, R., and Thompson, C. V., “Texture maps for orientation evolution during grain growth in thin films”, in Polycrystalline Thin Films: Structure, Texture, Properties, and Applications Ii, vol. 403, H. J. Frost, Parker, M. A., Ross, C. A., and Holm, E. A. 1996, pp. 63 - 70.