Publications
Found 2 results
Filters: Author is Marathe, Amit P. [Clear All Filters]
“Effects of active atomic sinks and reservoirs on the reliability of Cu/low-k interconnects”, Journal of Applied Physics, vol. 103, no. 8, 2008.
, “Electromigration-induced extrusion failures in Cu/low-k interconnects”, Journal of Applied Physics, vol. 104, no. 2, 2008.
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