Publications

Found 2 results
Filters: Author is Gilmer, G. H.  [Clear All Filters]
1997
S. Zhao, Agarwal, A. M., Benton, J. L., Gilmer, G. H., and Kimerling, L. C., Interstitial defect reactions in silicon, in Defects in Electronic Materials Ii, vol. 442, J. Michel, Kennedy, T., Wada, K., and Thonke, K. 1997, pp. 231 - 236.