Publications

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Filters: Author is Flanagan, K. A.  [Clear All Filters]
2000
K. Kono, Sandland, J. G., Wada, K., and Kimerling, L. C., Evaluation of irradiation-induced deep levels in Si, in X-Ray and Gamma-Ray Instrumentation for Astronomy Xi, vol. 4140, K. A. Flanagan and Siegmund, O. H. W. 2000, pp. 267 - 273.