Publications

Found 3 results
Filters: Author is CHO, J.  [Clear All Filters]
1990
J. CHO and Thompson, C. V., ELECTROMIGRATION-INDUCED FAILURES IN INTERCONNECTS WITH BIMODAL GRAIN-SIZE DISTRIBUTIONS, Journal of Electronic Materials, vol. 19, no. 11, pp. 1207 - 1212, 1990.
1989
J. CHO and Thompson, C. V., GRAIN-SIZE DEPENDENCE OF ELECTROMIGRATION-INDUCED FAILURES IN NARROW INTERCONNECTS, Applied Physics Letters, vol. 54, no. 25, pp. 2577 - 2579, 1989.