Publications

Found 372 results
Filters: Author is Carl V. Thompson  [Clear All Filters]
1994
Y. C. JOO and Thompson, C. V., ANALYTIC MODEL FOR THE GRAIN STRUCTURES OF NEAR-BAMBOO INTERCONNECTS, Journal of Applied Physics, vol. 76, no. 11, pp. 7339 - 7346, 1994.
J. A. FLORO, Thompson, C. V., CAREL, R., and BRISTOWE, P. D., COMPETITION BETWEEN STRAIN AND INTERFACE ENERGY DURING EPITAXIAL GRAIN-GROWTH IN AG FILMS ON NI(001), Journal of Materials Research, vol. 9, no. 9, pp. 2411 - 2424, 1994.
R. CAREL, Thompson, C. V., and FROST, H. J., COMPUTER-SIMULATION OF STRAIN-ENERGY AND SURFACE-ENERGY AND INTERFACE-ENERGY ON GRAIN-GROWTH IN THIN-FILMS, in Polycrystalline Thin Films: Structure, Texture, Properties and Applications, vol. 343, K. Barmak, Parker, M. A., Floro, J. A., Sinclair, R., and Smith, D. A. 1994, pp. 49 - 54.
H. J. FROST, HAYASHI, Y., Thompson, C. V., and WALTON, D. T., THE EFFECT OF SOLUTE DRAG ON GRAIN-GROWTH IN THIN-FILMS, in Mechanisms of Thin Film Evolution, vol. 317, S. M. Yalisove, Thompson, C. V., and Eaglesham, D. J. 1994, pp. 431 - 436.
H. J. FROST, HAYASHI, Y., Thompson, C. V., and WALTON, D. T., THE EFFECT OF SOLUTE DRAG ON GRAIN-GROWTH IN THIN-FILMS, in Mechanisms of Thin Film Evolution, vol. 317, S. M. Yalisove, Thompson, C. V., and Eaglesham, D. J. 1994, pp. 431 - 436.
H. J. FROST, HAYASHI, Y., Thompson, C. V., and WALTON, D. T., THE EFFECT OF VARIABILITY AMONG GRAIN-BOUNDARY ENERGIES ON GRAIN-GROWTH, in Materials Reliability in Microelectronics Iv, vol. 338, P. Borgesen, Coburn, J. C., Sanchez, J. E., Rodbell, K. P., and Filter, W. F. 1994, pp. 295 - 300.
Y. C. JOO and Thompson, C. V., ELECTROMIGRATION LIFETIMES OF SINGLE-CRYSTAL ALUMINUM LINES WITH DIFFERENT CRYSTALLOGRAPHIC ORIENTATIONS, in Materials Reliability in Microelectronics Iv, vol. 338, P. Borgesen, Coburn, J. C., Sanchez, J. E., Rodbell, K. P., and Filter, W. F. 1994, pp. 319 - 324.
J. A. FLORO, CAREL, R., and Thompson, C. V., ENERGY MINIMIZATION DURING EPITAXIAL GRAIN-GROWTH - STRAIN VS INTERFACIAL ENERGY, in Mechanisms of Thin Film Evolution, vol. 317, S. M. Yalisove, Thompson, C. V., and Eaglesham, D. J. 1994, pp. 419 - 424.
J. A. FLORO, CAREL, R., and Thompson, C. V., ENERGY MINIMIZATION DURING EPITAXIAL GRAIN-GROWTH - STRAIN VS INTERFACIAL ENERGY, in Mechanisms of Thin Film Evolution, vol. 317, S. M. Yalisove, Thompson, C. V., and Eaglesham, D. J. 1994, pp. 419 - 424.
M. F. NG and Cima, M. J., EPITAXIAL CHEMICALLY DERIVED LANTHANUM ALUMINATE FILMS FOR BA2YCU3O7-X DEVICES, in Mechanisms of Thin Film Evolution, vol. 317, S. M. Yalisove, Thompson, C. V., and Eaglesham, D. J. 1994, pp. 547 - 552.
C. V. Thompson, GRAIN-GROWTH IN POLYCRYSTALLINE THIN-FILMS, in Polycrystalline Thin Films: Structure, Texture, Properties and Applications, vol. 343, K. Barmak, Parker, M. A., Floro, J. A., Sinclair, R., and Smith, D. A. 1994, pp. 3 - 12.
H. J. FROST, HAYASHI, Y., Thompson, C. V., and WALTON, D. T., GRAIN-GROWTH IN THIN-FILMS WITH VARIABLE GRAIN-BOUNDARY ENERGY, in Mechanisms of Thin Film Evolution, vol. 317, S. M. Yalisove, Thompson, C. V., and Eaglesham, D. J. 1994, pp. 485 - 490.
H. J. FROST, HAYASHI, Y., Thompson, C. V., and WALTON, D. T., GRAIN-GROWTH IN THIN-FILMS WITH VARIABLE GRAIN-BOUNDARY ENERGY, in Mechanisms of Thin Film Evolution, vol. 317, S. M. Yalisove, Thompson, C. V., and Eaglesham, D. J. 1994, pp. 485 - 490.
G. Bochi, BALENTINE, C. A., INGLEFIELD, H. E., BOGOMOLOV, S. S., Thompson, C. V., and OHANDLEY, R. C., MAGNETIC-ANISOTROPY IN EPITAXIAL NI/CU(001) THIN-FILMS - EFFECTS OF MISFIT STRAIN ON PERPENDICULAR MAGNETIC-ANISOTROPY, Journal of Applied Physics, vol. 75, no. 10, pp. 6430 - 6430, 1994.
J. A. FLORO and Thompson, C. V., MEAN-FIELD ANALYSIS OF ORIENTATION SELECTIVE GRAIN-GROWTH DRIVEN BY INTERFACE-ENERGY ANISOTROPY, in Polycrystalline Thin Films: Structure, Texture, Properties and Applications, vol. 343, K. Barmak, Parker, M. A., Floro, J. A., Sinclair, R., and Smith, D. A. 1994, pp. 65 - 70.
J. S. RO, Thompson, C. V., and MELNGAILIS, J., MECHANISM OF ION-BEAM-INDUCED DEPOSITION OF GOLD, Journal of Vacuum Science & Technology B, vol. 12, no. 1, pp. 73 - 77, 1994.
M. F. NG and Cima, M. J., MICROSTRUCTURAL EVOLUTION OF EPITAXIAL MGAL2O4 THIN-FILMS DERIVED FROM METAL NITRATES AND FROM METAL ALKOXIDES, in Mechanisms of Thin Film Evolution, vol. 317, S. M. Yalisove, Thompson, C. V., and Eaglesham, D. J. 1994, pp. 577 - 582.
J. J. CLEMENT, Thompson, C. V., and ENVER, A., MODELING ELECTROMIGRATION-INDUCED STRESS BUILDUP DUE TO NONUNIFORM TEMPERATURE, in Materials Reliability in Microelectronics Iv, vol. 338, P. Borgesen, Coburn, J. C., Sanchez, J. E., Rodbell, K. P., and Filter, W. F. 1994, pp. 353 - 360.
H. J. FROST and Thompson, C. V., MODELING OF MICROSTRUCTURES AND THEIR EFFECT ON INTERCONNECT RELIABILITY, in Stress-Induced Phenomena in Metallization: Second International Workshop, P. S. Ho, Li, C. Y., and Totta, P. 1994, pp. 254 - 269.
1993
M. B. WISE, GUERIN, M. R., Thompson, C. V., and BUCHANAN, M. V., DIRECT SAMPLING ION-TRAP MASS-SPECTROMETRY FOR RAPID ENVIRONMENTAL-ANALYSIS, Abstracts of Papers of the American Chemical Society, vol. 206, p. 2 - ENVR, 1993.
C. V. Thompson, THE EFFECT OF THERMAL HISTORY ON INTERCONNECT RELIABILITY, in Materials Reliability in Microelectronics Iii, vol. 309, K. P. Rodbell, Filter, W. F., Frost, H. J., and Ho, P. S. 1993, pp. 383 - 394.
C. V. Thompson and KAHN, H., EFFECTS OF MICROSTRUCTURE ON INTERCONNECT AND VIA RELIABILITY - MULTIMODAL FAILURE STATISTICS, Journal of Electronic Materials, vol. 22, no. 6, pp. 581 - 587, 1993.
C. V. Thompson and LLOYD, JR, ELECTROMIGRATION AND IC INTERCONNECTS, Mrs Bulletin, vol. 18, no. 12, pp. 19 - 25, 1993.
Y. C. JOO and Thompson, C. V., EVOLUTION OF ELECTROMIGRATION-INDUCED VOIDS IN SINGLE-CRYSTALLINE ALUMINUM LINES WITH DIFFERENT CRYSTALLOGRAPHIC ORIENTATIONS, in Materials Reliability in Microelectronics Iii, vol. 309, K. P. Rodbell, Filter, W. F., Frost, H. J., and Ho, P. S. 1993, pp. 351 - 356.
A. D. DELLARATTA, MELNGAILIS, J., and Thompson, C. V., FOCUSED-ION BEAM-INDUCED DEPOSITION OF COPPER, Journal of Vacuum Science & Technology B, vol. 11, no. 6, pp. 2195 - 2199, 1993.

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