Found 8 results
Filters: Author is Kim, J. J.  [Clear All Filters]
S. R. Bishop, Druce, J., Kim, J. J., Kilner, J., and Tuller, H. L., Observation of surface impurities in Pr0.1Ce0.9O2-delta thin films following optical absorption relaxation measurements, Solid State Ionic Devices 9 - Ion Conducting Thin Films and Multilayers, vol. 50, no. 27, pp. 35 - 38, 2013.
J. J. Kim, Park, J. W., and Eagar, T. W., Interfacial microstructure of partial transient liquid phase bonded Si3N4-to-Inconel 718 joints, Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, vol. 344, no. 1-2, pp. 240 - 244, 2003.