Publications

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Filters: Author is Li, C. Y.  [Clear All Filters]
1994
H. J. FROST and Thompson, C. V., MODELING OF MICROSTRUCTURES AND THEIR EFFECT ON INTERCONNECT RELIABILITY, in Stress-Induced Phenomena in Metallization: Second International Workshop, P. S. Ho, Li, C. Y., and Totta, P. 1994, pp. 254 - 269.