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J. PALM and Kimerling, L. C., Defects and future silicon technology, in Defect and Impurity Engineered Semiconductors and Devices, vol. 378, S. Ashok, Chevallier, J., Akasaki, I., Johnson, N. M., and Sopori, B. L. 1995, pp. 703 - 711.
J. Michel, PALM, J., Gan, F., Ren, F. Y. G., Zheng, B., Dunham, S. T., and Kimerling, L. C., Erbium in silicon: A defect system for optoelectronic integrated circuits, in Icds-18 - Proceedings of the 18th International Conference on Defects in Semiconductors, Pts 1-4, vol. 196-, M. Suezawa and KatayamaYoshida, H. 1995, pp. 585 - 589.