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H. MSAAD, NORGA, G. J., Michel, J., and Kimerling, L. C., DEFECT MONITORING AND CONTROL FOR CRYSTALLINE SILICON PROCESSING, in 12th Nrel Photovoltaic Program Review, R. Noufi and Ullal, H. S. 1994, pp. 471 - 477.
H. MSAAD, Michel, J., LAPPE, J. J., and Kimerling, L. C., ELECTRONIC PASSIVATION OF SILICON SURFACES BY HALOGENS, Journal of Electronic Materials, vol. 23, no. 5, pp. 487 - 491, 1994.