Publications

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2012
E. Johlin, Tabet, N., Castro-Galnares, S., Abdallah, A., Bertoni, M. I., Asafa, T., Grossman, J. C., Said, S., and Buonassisi, T., “Structural origins of intrinsic stress in amorphous silicon thin films”, Physical Review B, vol. 85, no. 7, 2012.