Publications
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Filters: Author is Chim, W. K. [Clear All Filters]
“First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials”, Physica Status Solidi-Rapid Research Letters, vol. 2, no. 5, pp. 227 - 229, 2008.
, “First-principles study of native point defects in hafnia and zirconia”, Physical Review B, vol. 75, no. 10, 2007.
, “Influence of reductant and germanium concentration on the growth and stress development of germanium nanocrystals in silicon oxide matrix”, Nanotechnology, vol. 18, no. 6, 2007.
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“Native point defects in yttria and relevance to its use as a high-dielectric-constant gate oxide material: First-principles study”, Physical Review B, vol. 73, no. 10, 2006.
, “Stress development of germanium nanocrystals in silicon oxide matrix”, Applied Physics Letters, vol. 89, no. 11, 2006.
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