Spatial distribution of structural degradation under high-power stress in AlGaN/GaN high electron mobility transistors

TitleSpatial distribution of structural degradation under high-power stress in AlGaN/GaN high electron mobility transistors
Publication TypeJournal Article
Year of Publication2012
AuthorsLi, L, Joh, J, del Alamo, JA, Thompson, CV
JournalApplied Physics Letters
Volume100
Issue17
Date Published2012/04/23/
ISBN Number0003-6951