In situ transmission electron microscope studies of the kinetics of abnormal grain growth in electroplated copper films

TitleIn situ transmission electron microscope studies of the kinetics of abnormal grain growth in electroplated copper films
Publication TypeJournal Article
Year of Publication2000
AuthorsHau-Riege, SP, Thompson, CV
JournalApplied Physics Letters
Volume76
Issue3
Pagination309 - 311
Date Published2000/01/17/
ISBN Number0003-6951