Simulation of the temperature and current density scaling of the electromigration-limited reliability of near-bamboo interconnects

TitleSimulation of the temperature and current density scaling of the electromigration-limited reliability of near-bamboo interconnects
Publication TypeJournal Article
Year of Publication1998
AuthorsKnowlton, BD, Thompson, CV
JournalJournal of Materials Research
Volume13
Issue5
Pagination1164 - 1170
Date Published1998/05//
ISBN Number0884-2914