Revisiting the "In-clustering" question in InGaN through the use of aberration-corrected electron microscopy below the knock-on threshold

TitleRevisiting the "In-clustering" question in InGaN through the use of aberration-corrected electron microscopy below the knock-on threshold
Publication TypeJournal Article
Year of Publication2013
AuthorsBaloch, KH, Johnston-Peck, AC, Kisslinger, K, Stach, EA, Gradecak, S
JournalApplied Physics Letters
Volume102
Issue19
Date Published2013/05/13/
ISBN Number0003-6951