On the redox origin of surface trapping in AlGaN/GaN high electron mobility transistors

TitleOn the redox origin of surface trapping in AlGaN/GaN high electron mobility transistors
Publication TypeJournal Article
Year of Publication2014
AuthorsGao, F, Chen, D, Tuller, HL, Thompson, CV, Palacios, T
JournalJournal of Applied Physics
Volume115
Issue12
Date Published2014/03/28/
ISBN Number0021-8979