Optical and nanomechanical characterization of an onmidirectional reflector encompassing 850 nm wavelength

TitleOptical and nanomechanical characterization of an onmidirectional reflector encompassing 850 nm wavelength
Publication TypeBook Chapter
Year of Publication2004
AuthorsDeopura, M, Fink, Y, Schuh, CA
EditorShin, JH, Brongersma, M, Buchal, C, Priolo, F
Book TitleNew Materials for Microphotonics
Volume817
Pagination95 - 100
Abstract

We demonstrate that multilayers composed of nineteen alternating layers of tin sulfide and silica can function as omnidirectional reflectors. These materials exhibit omnidirectional reflectivity for a range of frequencies in the near infra-red (NIR) encompassing the 850 nm wavelength. A refractive index contrast of 2.7/1.46 is achieved, one of the highest values demonstrated until now in NIR photonic bad gaps. In addition, new nanoindentation procedures have been developed to measure mechanical properties of these fine laminate materials, and demonstrate that tin sulfide-silica multilayers are mechanically stable for practical applications.