|Title||Optical and nanomechanical characterization of an onmidirectional reflector encompassing 850 nm wavelength|
|Publication Type||Book Chapter|
|Year of Publication||2004|
|Authors||Deopura, M, Fink, Y, Schuh, CA|
|Editor||Shin, JH, Brongersma, M, Buchal, C, Priolo, F|
|Book Title||New Materials for Microphotonics|
|Pagination||95 - 100|
We demonstrate that multilayers composed of nineteen alternating layers of tin sulfide and silica can function as omnidirectional reflectors. These materials exhibit omnidirectional reflectivity for a range of frequencies in the near infra-red (NIR) encompassing the 850 nm wavelength. A refractive index contrast of 2.7/1.46 is achieved, one of the highest values demonstrated until now in NIR photonic bad gaps. In addition, new nanoindentation procedures have been developed to measure mechanical properties of these fine laminate materials, and demonstrate that tin sulfide-silica multilayers are mechanically stable for practical applications.