Omnidirectional reflectance and optical gap properties of Si/SiO2 Thue-Morse quasicrystals

TitleOmnidirectional reflectance and optical gap properties of Si/SiO2 Thue-Morse quasicrystals
Publication TypeBook Chapter
Year of Publication2004
AuthorsDal Negro, L, Stolfi, M, Yi, Y, Michel, J, Duan, X, Kimerling, LC, LeBlanc, J, Haavisto, J
EditorShin, JH, Brongersma, M, Buchal, C, Priolo, F
Book TitleNew Materials for Microphotonics
Volume817
Pagination75 - 81
ISBN Number1-55899-767-9