A NEW ELECTROMIGRATION TESTING TECHNIQUE FOR RAPID STATISTICAL EVALUATION OF INTERCONNECT TECHNOLOGY

TitleA NEW ELECTROMIGRATION TESTING TECHNIQUE FOR RAPID STATISTICAL EVALUATION OF INTERCONNECT TECHNOLOGY
Publication TypeJournal Article
Year of Publication1986
AuthorsThompson, CV, CHO, J
JournalIeee Electron Device Letters
Volume7
Issue12
Pagination667 - 668
Date Published1986/12//
ISBN Number0741-3106