Microscopic evidence of point defect incorporation in laterally overgrown GaN

TitleMicroscopic evidence of point defect incorporation in laterally overgrown GaN
Publication TypeJournal Article
Year of Publication2002
AuthorsGradecak, S, Wagner, V, Ilegems, M, Riemann, T, Christen, J, Stadelmann, P
JournalApplied Physics Letters
Volume80
Issue16
Pagination2866 - 2868
Date Published2002/04/22/
ISBN Number0003-6951