Mechanism maps for electromigration-induced failure of metal and alloy interconnects

TitleMechanism maps for electromigration-induced failure of metal and alloy interconnects
Publication TypeJournal Article
Year of Publication1999
AuthorsAndleigh, VK, Srikar, VT, Park, YJ, Thompson, CV
JournalJournal of Applied Physics
Volume86
Issue12
Pagination6737 - 6745
Date Published1999/12/15/
ISBN Number0021-8979