Impurity centers in silicon doped with rare-earth impurities of dysprosium, holmium, erbium, and ytterbium

TitleImpurity centers in silicon doped with rare-earth impurities of dysprosium, holmium, erbium, and ytterbium
Publication TypeJournal Article
Year of Publication1999
AuthorsEmtsev, VV, Emtsev, VV, Poloskin, DS, Sobolev, NA, Shek, EI, Michel, J, Kimerling, LC
JournalSemiconductors
Volume33
Issue6
Pagination603 - 605
Date Published1999/06//
ISBN Number1063-7826