Implications and applications of zero creep experiments for the stability of multilayer structures

TitleImplications and applications of zero creep experiments for the stability of multilayer structures
Publication TypeBook
Year of Publication1996
AuthorsJosell, D, Carter, WCraig
Corporate AuthorsMerchant, H. D.
Abstract

The basic theory for determining interfacial free energies from the results of uniaxial zero creep experiments on multilayers is accompanied by some experimental results. Biaxial zero creep experiments utilizing wafer curvature techniques are also described. Modeling of instabilities associated with the interface and grain boundary free energies demonstrates some of the mechanisms by which the morphology of layered structures can degrade. Implications of successful and unsuccessful zero creep experiments on the mechanisms by which the morphology of the multilayer materials evolve are noted.