|Title||Implications and applications of zero creep experiments for the stability of multilayer structures|
|Year of Publication||1996|
|Authors||Josell, D, Carter, WCraig|
|Corporate Authors||Merchant, H. D.|
The basic theory for determining interfacial free energies from the results of uniaxial zero creep experiments on multilayers is accompanied by some experimental results. Biaxial zero creep experiments utilizing wafer curvature techniques are also described. Modeling of instabilities associated with the interface and grain boundary free energies demonstrates some of the mechanisms by which the morphology of layered structures can degrade. Implications of successful and unsuccessful zero creep experiments on the mechanisms by which the morphology of the multilayer materials evolve are noted.