High-quality Ge epilayers on Si with low threading-dislocation densities

TitleHigh-quality Ge epilayers on Si with low threading-dislocation densities
Publication TypeJournal Article
Year of Publication1999
AuthorsLuan, HC, Lim, DR, Lee, KK, Chen, KM, Sandland, JG, Wada, K, Kimerling, LC
JournalApplied Physics Letters
Volume75
Issue19
Pagination2909 - 2911
Date Published1999/11/08/
ISBN Number0003-6951