Experimental characterization and modeling of the reliability of interconnect trees

TitleExperimental characterization and modeling of the reliability of interconnect trees
Publication TypeJournal Article
Year of Publication2001
AuthorsHau-Riege, SP, Thompson, CV
JournalJournal of Applied Physics
Volume89
Issue1
Pagination601 - 609
Date Published2001/01/01/
ISBN Number0021-8979