Erbium in silicon: A defect system for optoelectronic integrated circuits

TitleErbium in silicon: A defect system for optoelectronic integrated circuits
Publication TypeBook Chapter
Year of Publication1995
AuthorsMichel, J, PALM, J, Gan, F, Ren, FYG, Zheng, B, Dunham, ST, Kimerling, LC
EditorSuezawa, M, KatayamaYoshida, H
Book TitleIcds-18 - Proceedings of the 18th International Conference on Defects in Semiconductors, Pts 1-4
Volume196-
Pagination585 - 589
ISBN Number0-87849-716-1