Electromigration proximity effects of two neighboring fast-diffusion segments in single-crystal aluminum lines

TitleElectromigration proximity effects of two neighboring fast-diffusion segments in single-crystal aluminum lines
Publication TypeJournal Article
Year of Publication1999
AuthorsJoo, YC, Thompson, CV, Baker, SP, Arzt, E
JournalJournal of Applied Physics
Volume85
Issue4
Pagination2108 - 2113
Date Published1999/02/15/
ISBN Number0021-8979