Electromigration-induced transgranular failure mechanisms in single-crystal aluminum interconnects

TitleElectromigration-induced transgranular failure mechanisms in single-crystal aluminum interconnects
Publication TypeJournal Article
Year of Publication1997
AuthorsJoo, YC, Thompson, CV
JournalJournal of Applied Physics
Volume81
Issue9
Pagination6062 - 6072
Date Published1997/05/01/
ISBN Number0021-8979