Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

TitleElectric-field-induced current-voltage characteristics in electronic conducting perovskite thin films
Publication TypeJournal Article
Year of Publication2012
AuthorsRupp, JLM, Reinhard, P, Pergolesi, D, Ryll, T, Toelke, R, Traversa, E
JournalApplied Physics Letters
Volume100
Issue1
Pagination012101
Date Published2012/01/02/
Abstract

Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O(3-d) perovskite family are well described in their charge transport through their high temperature applications, i.e., as solid-oxide fuel cell electrodes (600-1000 degrees C). In this study, the current-voltage (I-V) profiles of these well-known MIEC perovskites are studied between room temperature and 150 degrees C under bias of +/- 15V for potential applications in resistance random access memories. The impact of the metal-oxide interface on the I-V characteristics ranging from ohmic to non-linear hysteretic is discussed for metals of varying work functions and redox potentials, as well as changes in metal electrode distances and areas. (C) 2012 American Institute of Physics. [doi: 10.1063/1.3663529]