Effects of Side Reservoirs on the Electromigration Lifetime of Copper Interconnects

TitleEffects of Side Reservoirs on the Electromigration Lifetime of Copper Interconnects
Publication TypeJournal Article
Year of Publication2011
AuthorsMario, H, Gan, CLip, Lim, YKheng, Tan, JBoon, Wei, J, Chookajorn, T, Thompson, CV
Journal2011 18th Ieee International Symposium on the Physical and Failure Analysis of Integrated Circuits (ipfa)
Date Published2011///
ISBN Number1946-1550