The effects of microstructural transitions at width transitions on interconnect reliability

TitleThe effects of microstructural transitions at width transitions on interconnect reliability
Publication TypeJournal Article
Year of Publication2000
AuthorsHau-Riege, CS, Thompson, CV
JournalJournal of Applied Physics
Volume87
Issue12
Pagination8467 - 8472
Date Published2000/06/15/
ISBN Number0021-8979