THE EFFECT OF THERMAL HISTORY ON INTERCONNECT RELIABILITY

TitleTHE EFFECT OF THERMAL HISTORY ON INTERCONNECT RELIABILITY
Publication TypeBook Chapter
Year of Publication1993
AuthorsThompson, CV
EditorRodbell, KP, Filter, WF, Frost, HJ, Ho, PS
Book TitleMaterials Reliability in Microelectronics Iii
Volume309
Pagination383 - 394
ISBN Number1-55899-205-7