Edge dislocation slows down oxide ion diffusion in doped CeO2 by segregation of charged defects.

TitleEdge dislocation slows down oxide ion diffusion in doped CeO2 by segregation of charged defects.
Publication TypeJournal Article
Year of Publication2015
AuthorsSun, L, Marrocchelli, D, Yildiz, B
JournalNature communications
Volume6
Pagination6294 - 6294
Date Published2015/02/27/