Correlation between leakage current density and threading dislocation density in SiGe p-i-n diodes grown on relaxed graded buffer layers

TitleCorrelation between leakage current density and threading dislocation density in SiGe p-i-n diodes grown on relaxed graded buffer layers
Publication TypeJournal Article
Year of Publication2001
AuthorsGiovane, LM, Luan, HC, Agarwal, AM, Kimerling, LC
JournalApplied Physics Letters
Volume78
Issue4
Pagination541 - 543
Date Published2001/01/22/
ISBN Number0003-6951