Evolution of structural defects associated with electrical degradation in AlGaN/GaN high electron mobility transistors

TitleEvolution of structural defects associated with electrical degradation in AlGaN/GaN high electron mobility transistors
Publication TypeJournal Article
Year of Publication2010
AuthorsMakaram, P, Joh, J, del Alamo, JA, Palacios, T, Thompson, CV
JournalApplied Physics Letters
Volume96
Issue23
Date Published2010/06/07/
ISBN Number0003-6951