Electromigration resistance in a short three-contact interconnect tree

TitleElectromigration resistance in a short three-contact interconnect tree
Publication TypeJournal Article
Year of Publication2006
AuthorsChang, CW, Choi, ZS, Thompson, CV, Gan, CL, Choi, WK, Hwang, N
JournalJournal of Applied Physics
Volume99
Issue9
Date Published2006/05/01/
ISBN Number0021-8979