Depth-profiling X-ray photoelectron spectroscopy (XPS) analysis of interlayer diffusion in polyelectrolyte multilayers

TitleDepth-profiling X-ray photoelectron spectroscopy (XPS) analysis of interlayer diffusion in polyelectrolyte multilayers
Publication TypeJournal Article
Year of Publication2013
AuthorsGilbert, JB, Rubner, MF, Cohen, RE
JournalProceedings of the National Academy of Sciences of the United States of America
Volume110
Issue17
Pagination6651 - 6656
Date Published2013/04/23/
ISBN Number0027-8424