Native point defects in yttria and relevance to its use as a high-dielectric-constant gate oxide material: First-principles study

TitleNative point defects in yttria and relevance to its use as a high-dielectric-constant gate oxide material: First-principles study
Publication TypeJournal Article
Year of Publication2006
AuthorsZheng, JX, Ceder, G, Maxisch, T, Chim, WK, Choi, WK
JournalPhysical Review B
Volume73
Issue10
Date Published2006/03//
ISBN Number1098-0121